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Monitoring the array in reset-read-read mode

SWIR 3


Show NOTCam R-R-R database

Gain for each quadrant


Plotted line correspond to mean value
X-axis tics are plotted every 10th day





Read out noise for each quadrant


Plotted line correspond to mean value
X-axis tics are plotted every 10th day





Normalized count rate for each quadrant from newest data


In the 3 first points there may be a significant shutter effect.
Normalization is done using 4th, 5th and 6th points.
Light level during the test may not be constant enough to give very reliable result.




Reset levels for each quadrant


Plotted green line corresponds to mean value
Errorbars correspond to standard deviation
Blue (yellow) lines show max (min) values
X-axis tics are plotted every 10th day






Amount of zero pixels (%)


X-axis tics are plotted every 10th day



Zero pixel map shows where zero pixels are in latest data.



Full resolution zero pixel map




Amount of hot pixels (%)


Fraction of pixels that deviate more than 8-sigma from mean value.
Used exposure time was 42 seconds.
X-axis tics are plotted every 10th day





Amount of cold pixels (%)


Fraction of pixels that deviate more than 8-sigma from mean value.
Used exposure time was 42 seconds.
X-axis tics are plotted every 10th day





Temperature of the array


Mean temperature of the array during test.
Minimum and maximum temperatures during the test are indicated by the error bar.
X-axis tics are plotted every 10th day






Dark current count dependency on exp time


Red points correspond to latest data
Blue lines refer to 5 previous situations
Number of counts per known exp time, 0s included





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