Overview of instrumentation

• Facility instruments
• Instruments with limited access
• Instrument capabilities
• Instrument User Groups
• Optical and IR Filters
• Detectors
• Detector Quality Monitoring
• FITS headers and software
• Overheads when observing

Facility instruments

• ALFOSC - UV-optical imaging, polarimetry and low-resolution spectroscopy
• NOTCam - NIR imaging, polarimetry and low-resolution spectroscopy
• FIES - High-resolution, high-stability optical spectroscopy
• MOSCA - High-resolution, high-efficiency UV-optical imaging
• StanCam - Standby CCD imager

Instrumentation with limited access

• SOFIN - The Soviet-Finnish optical high-resolution spectrograph
• TURPOL - The Turku photo-polarimeter

Other instruments

• LuckyCam - High resolution "Lucky" imaging in the visible
• PolCor - The PolCor "Lucky" Polarimeter/coronagraph

Instrument capabilities

Optical imaging

Instrument	Detector	Filters	Scale ("/pixel)	Field-of-View	Contact	Comments
ALFOSC imaging	E2V 2kx2k	Various optical filters	0.19	6'.4 x 6'.4	TP,TA	also polarimetry also fast-phot mode
StanCam	SITe 1kx1k	Various optical filters	0.18	3'.0 x 3'.0	TP,TA
MOSCA	2x2 mosaic of 2kx2k Loral	100mm diameter; SDSS, UBVRI, Stromgren	0.11	7'.7 x 7'.7	TP,TA

Infrared imaging

Instrument	Detector	Filters	Scale ("/pixel)	Field-of-View	Contact	Comments
NOTcam	HAWAII 1kx1k HgCdTe	NOTcam filters	0.23 (WFC) or 0.08 (HRC)	3'.9 x 3'.9 or 1'.4 x 1'.4	AD,TA	wavelength range: 1.0-2.5 micron;

Optical spectroscopy

Instrument	Wavelength Range	Dispersion (Å/pixel)	Slit Length	Detector	Contact	Comments
ALFOSC spectroscopy	3200-11000Å	0.26-13.7 for long slit 0.4 in echelle mode	5' for long slit 8" in echelle mode	E2V 2kx2k	JT,TA	also spectropolarimetry; also Multi Object (MOS) mode
FIES	3700-7400Å	R=25000, 47000, 68000	Fiber-fed: 1.3" on sky, 2.5" for R=25000	CCD 13	JT
SOFIN	3200-10800Å	R=27000-170000	variable short slit	Loral 2kx2k EEV7	JT	also spectropolarimetry; SOFIN is not a common-user instrument: only limited support is provided

Near-IR spectroscopy

Instrument	Wavelength Range	Dispersion (Å/pixel)	Slit Length	Detector	Contact	Comments
NOTCAM WFC low-res spectroscopy	'Z' J H K	4.1 in K 2.5 in J	4'	HAWAII 1kx1k HgCdTe	JT,AD	R=2000 for WFC
NOTCAM HRC med-res spectroscopy	1.26-1.34 (Pa-beta) 1.57-1.67 2.07-2.20 (Br-gamma)	1.4 in K 0.8 in J	80''	HAWAII 1kx1k HgCdTe	JT,AD	R~5500 for HRC

Instrument specialists:
TA: Thomas Augusteijn, AD: Anlaug Amanda Djupvik, TP: Tapio Pursimo, JT: John Telting. See here for contact information.

Instrument User Groups

In May 2003 Instrument User Groups have been appointed to advise the NOT Director and STC on the current performance of the instrumentation at NOT, and on the desirability and priorities of instrument upgrades in the short and long term. The Instrument User Groups and their fields of responsibility are:

• Optical Imaging: Chair: H. Dahle, Oslo (Chair), J. Hjorth (Copenhagen), G. Östlin (Stockholm), and T. Pursimo (NOT)
• Near-IR Imaging: J. Kotilainen, Turku (Chair), A. Djupvik (NOT) and B. Thomsen (Aarhus)
• Optical and Near-IR Low-Resolution Spectroscopy: J. Fynbo, Copenhagen (Chair), T. Augusteijn (NOT), and N. Ryde (Uppsala)
• High-Resolution Optical Spectroscopy: T. Hackman, Helsinki (Chair), S. Frandsen (Aarhus), N. Piskunov (Uppsala), and J. Telting (NOT).