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Overview of instrumentation


Facility instruments

  • ALFOSC - UV-optical imaging, polarimetry and low-resolution spectroscopy
  • NOTCam - NIR imaging and low-resolution spectroscopy
  • FIES - High-resolution, high-stability optical spectroscopy
  • MOSCA - High-resolution, high-efficiency UV-optical imaging
  • StanCam - Standby CCD imager

Instrumentation with limited access

  • DIPol-UF - Three-band high-speed polarimeter
  • SOFIN - The Soviet-Finnish optical high-resolution spectrograph

Other (former) instruments

  • LuckyCam - High resolution "Lucky" imaging in the visible
  • PolCor - The PolCor "Lucky" Polarimeter/coronagraph
  • SIRCA - The Stockholm InfraRed CAmera
  • TurPol: Photo-polarimeter

Instrument capabilities

Optical imaging
Instrument Detector Filters Scale (arcsec/pixel) Field-of-View Contact Comments
ALFOSC imaging E2V 2kx2k Various optical filters 0.214 6'.7 x 6'.7 TP,TA also polarimetry
StanCam SITe 1kx1k Various optical filters 0.18 3'.0 x 3'.0 TP,TA
MOSCA 2x2 mosaic of
2kx2k Loral
100mm diameter;
SDSS, UBVRI, Stromgren
0.11 7'.7 x 7'.7 TP,TA
DIPol-UF Andor iXon Ultra 897 EM CCD cameras Three-channel BVR 0.12 1' x 1' in B,
0.7' x 0.7' in V and R
See here High-speed photometry; also polarimetry
DIPol-UF is not a common-user instrument, but is only supported during specific periods

Infrared imaging
Instrument Detector Filters Scale (arcsec/pixel) Field-of-View Contact Comments
NOTcam HAWAII 1kx1k HgCdTe NOTcam filters 0.23 (WFC) or
0.08 (HRC)
3'.9 x 3'.9 or
1'.4 x 1'.4
AD,TA wavelength range:
1.0-2.5 micron;

Optical spectroscopy
Instrument Wavelength Range Dispersion (Å/pixel) Slit Length Detector Contact Comments
ALFOSC spectroscopy 3200-11000Å 0.26-13.7 for long slit
0.4 in echelle mode
5' for long slit
8" in echelle mode
E2V 2kx2k JT,TA also spectropolarimetry;
also Multi Object (MOS) mode
FIES 3620-8980Å R=25000, 45000, 65000 Fiber-fed: 1.3" on sky, 2.5" for R=25000 CCD 15 JT Low-res (R=25000) wave range 3620-8580
Med-res (R=45000) wave range 3640-8840
High-res (R=65000) wave range 3640-8980
SOFIN 3200-10800Å R=80000 variable short slit Loral 2kx2k
EEV7
JT Only spectropolarimetry;
SOFIN is not a common-user instrument: only limited support is provided

Near-IR spectroscopy
Instrument Wavelength Range Dispersion (Å/pixel) Slit Length Detector Contact Comments
NOTCAM WFC low-res spectroscopy 'Z' J H K 4.1 in K
2.5 in J
4' HAWAII 1kx1k HgCdTe JT,AD R=2000 for WFC
NOTCAM HRC med-res spectroscopy 1.26-1.34 (Pa-beta)
1.57-1.67
2.07-2.20 (Br-gamma)
1.4 in K
0.8 in J
80'' HAWAII 1kx1k HgCdTe JT,AD R~5500 for HRC

Polarimetry
Instrument Filters Detector Scale (arcsec/pixel) Field of view Modes Contact Comments
ALFOSC FAPOL+ calcite Various optical filters E2V 2kx2k 0.21 140arcsec diameter linear and/or circular AD,TP also spectropolarimetry
ALFOSC polaroid Various optical filters E2V 2kx2k 0.21 7'.3 x 7'.3 linear AD,TP for extended targets
ALFOSC +WeDoWo Various optical filters E2V 2kx2k 0.21 linear AD,TP available from April 1, 2010
DIPol-UF Three-channel BVR Andor iXon Ultra 897 EM CCD cameras 0.12 1' x 1' in B,
0.7' x 0.7' in V and R
linear or circular See here High-speed polarimetry; also photometry
DIPol-UF is not a common-user instrument, but is only supported during specific periods

Instrument specialists:
TA: Thomas Augusteijn, AD: Anlaug Amanda Djupvik, TP: Tapio Pursimo, JT: John Telting. See here for contact information.


Instrument User Groups

In May 2003 Instrument User Groups have been appointed to advise the NOT Director and STC on the current performance of the instrumentation at NOT, and on the desirability and priorities of instrument upgrades in the short and long term. The Instrument User Groups and their fields of responsibility are:

  • Optical Imaging: Chair: H. Dahle, Oslo (Chair), J. Hjorth (Copenhagen), G. Östlin (Stockholm), and T. Pursimo (NOT)
  • Near-IR Imaging: J. Kotilainen, Turku (Chair), A. Djupvik (NOT) and B. Thomsen (Aarhus)
  • Optical and Near-IR Low-Resolution Spectroscopy: J. Fynbo, Copenhagen (Chair), T. Augusteijn (NOT), and N. Ryde (Uppsala)
  • High-Resolution Optical Spectroscopy: T. Hackman, Helsinki (Chair), S. Frandsen (Aarhus), N. Piskunov (Uppsala), and J. Telting (NOT).
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